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Esaka, Fumitaka; Magara, Masaaki
Mass Spectrometry Letters, 7(2), p.41 - 44, 2016/06
Secondary ion mass spectrometry (SIMS) is a promising tool to measure isotope ratios of individual uranium particles in environmental samples for nuclear safeguards. However, the analysis requires prior identification of a small number of uranium particles that coexist with a large number of other particles without uranium. In the present study, this identification was performed by scanning electron microscopy -energy dispersive X-ray analysis with automated particle search mode. The analytical results for an environmental sample taken at a nuclear facility indicated that the observation of backscattered electron images with 
1000 magnification was appropriate to efficiently identify uranium particles. Lower magnification (less than 500) made it difficult to detect smaller particles of approximately 1 
m diameter.
Oya, Yasuhisa*; Hirohata, Yuko*; Tanabe, Tetsuo*; Shibahara, Takahiro*; Kimura, Hiromi*; Oyaizu, Makoto*; Arai, Takashi; Masaki, Kei; Goto, Yoshitaka*; Okuno, Kenji*; et al.
Fusion Engineering and Design, 75-79, p.945 - 949, 2005/11
Times Cited Count：9 Percentile：53.19(Nuclear Science & Technology)no abstracts in English
Magara, Masaaki; Usuda, Shigekazu; Sakurai, Satoshi; Watanabe, Kazuo; Esaka, Fumitaka; Hirayama, Fumio; Lee, C. G.; Yasuda, Kenichiro; Kono, Nobuaki; Inagawa, Jun; et al.
Dai-26-Kai Kaku Busshitsu Kanri Gakkai (INMM) Nihon Shibu Nenji Taikai Rombunshu, p.157 - 164, 2005/00
JAERI has conducted the analysis of domestic and the IAEA samples. JAERI is developing the analytical techniques to improve the analytical ability for the safeguards environmental samples. For bulk analysis, study is focused on the improvement of reliability of isotope ratio measurements by ICP-MS. New chemical separation techniques are under development and a desolvation module is introduced to reduce the polyatomic interferences. In particle analysis, the sample preparation procedure for SIMS method is modified to measure the 
U/
U and 
U/U ratios for individual particles. We are also developing fission track-TIMS method to measure uranium isotope ratios in particles of sub-micrometer size. A screening instrument of X-ray fluorescent analysis is equipped to measure elemental distribution on a swipe surface.
Esaka, Fumitaka; Watanabe, Kazuo; Fukuyama, Hiroyasu; Onodera, Takashi; Esaka, Konomi; Magara, Masaaki; Sakurai, Satoshi; Usuda, Shigekazu
Journal of Nuclear Science and Technology, 41(11), p.1027 - 1032, 2004/11
Times Cited Count：60 Percentile：95.56(Nuclear Science & Technology)A new particle recovery method and a sensitive screening method were developed for subsequent isotope ratio analysis of uranium particles in safeguards swipe samples. The particles in the swipe sample were recovered onto a carrier by means of vacuum suction 8211; impact collection method. When grease coating was applied to the carrier, the recovery efficiency was improved to 48 %, which is superior to that of conventionally-used ultrasoneration method. Prior to isotope ratio analysis with secondary ion mass spectrometry (SIMS), total reflection X-ray fluorescence spectrometry (TXRF) was applied to screen the sample for the presence of uranium particles. By the use of Si carriers in TXRF analysis, the detection limit of 22 pg was achieved for uranium. By combining these methods with SIMS, the isotope ratios of 
U/U for individual uranium particles were efficiently determined.
Wakai, Eiichi; Sato, Michitaka*; Sawai, Tomotsugu; Shiba, Kiyoyuki; Jitsukawa, Shiro
Materials Transactions, 45(2), p.407 - 410, 2004/01
Times Cited Count：6 Percentile：32.72(Materials Science, Multidisciplinary)no abstracts in English
Oya, Yasuhisa*; Morimoto, Yasutomi*; Oyaizu, Makoto*; Hirohata, Yuko*; Yagyu, Junichi; Miyo, Yasuhiko; Goto, Yoshitaka*; Sugiyama, Kazuyoshi*; Okuno, Kenji*; Miya, Naoyuki; et al.
Physica Scripta, T108, p.57 - 62, 2004/00
no abstracts in English
/4H-SiC(0001) interfaceYamashita, Kenya*; Kitabatake, Makoto*; Kusumoto, Osamu*; Takahashi, Kunimasa*; Uchida, Masao*; Miyanaga, Ryoko*; Ito, Hisayoshi; Yoshikawa, Masahito
Materials Science Forum, 389-393, p.1037 - 1040, 2002/00
Times Cited Count：3 Percentile：16.11(Materials Science, Multidisciplinary)no abstracts in English
Esaka, Fumitaka; Watanabe, Kazuo; Magara, Masaaki; Hanzawa, Yukiko; Usuda, Shigekazu
Journal of Trace and Microprobe Techniques, 19(4), p.487 - 496, 2001/11
Times Cited Count：9 Percentile：30.14(Chemistry, Analytical)The capability of total-reflection X-ray fluorescence spectrometry (TXRF) technique was studied to screen a swipe sample for uranium content, which was employed to decide on the further isotopic ratio measurements by secondary ion mass spectrometry (SIMS) for safeguards environmental sample analysis. A part of the measurement system of TXRF was modified to be able to use the same glassy carbon carrier for SIMS analysis. Particles in the swipe sample were recovered on the carbon carrier. The relative sensitivities of 11 elements including uranium were determined using selenium as an internal standard. The detection limit of uranium was 0.4 ng. The screening technique studied was applied to the practical swipe samples taken from the laboratories. The results confirm that TXRF can be a promising screening technique for uranium in swipe samples for safeguards environmental sample analysis.
Magara, Masaaki; Hanzawa, Yukiko; Esaka, Fumitaka; Miyamoto, Yutaka; Yasuda, Kenichiro; Watanabe, Kazuo; Usuda, Shigekazu; Nishimura, Hideo; Adachi, Takeo
Applied Radiation and Isotopes, 53(1-2), p.87 - 90, 2000/07
Times Cited Count：28 Percentile：84.32(Chemistry, Inorganic & Nuclear)no abstracts in English
Esaka, Fumitaka; Watanabe, Kazuo; Magara, Masaaki; Hanzawa, Yukiko; Usuda, Shigekazu; Gunji, Katsubumi; Nishimura, Hideo; Adachi, Takeo
Proceedings of 12th International Conference on Secondary Ion Mass Spectrometry (SIMS 12), p.977 - 980, 2000/00
no abstracts in English
Isobe, Hiroshi; Hidaka, Hiroshi*; Onuki, Toshihiko
Mat. Res. Soc. Symp. Proc., 506, p.687 - 694, 1998/00
no abstracts in English
*; Aoki, Yasushi; Nagai, Shiro
JAERI-Research 94-018, 45 Pages, 1994/10
JAERI-Research-94-018.pdf:1.2MB
no abstracts in English
*; Aoki, Yasushi; Nagai, Shiro
Dai-4-Kai Ryushisen No Sentanteki Oyo Gijutsu Ni Kansuru Shimpojiumu, p.175 - 178, 1993/00
no abstracts in English
, N, CO
, and CO ion bombardmentNagai, Shiro
Nuclear Instruments and Methods in Physics Research B, 59-60, p.936 - 939, 1991/00
Times Cited Count：3 Percentile：50.32(Instruments & Instrumentation)no abstracts in English
by light-ion bombardments;
Journal of Nuclear Materials, 145-147, p.396 - 400, 1987/00
Times Cited Count：4 Percentile：44.92(Materials Science, Multidisciplinary)no abstracts in English
; H.Gnaser*; W.O.Hofer*
Nuclear Instruments and Methods in Physics Research B, 28, p.540 - 547, 1987/00
Times Cited Count：11 Percentile：76.84(Instruments & Instrumentation)no abstracts in English
H.Gnaser*; ; J.von.Seggern*; W.O.Hofer*
Nuclear Instruments and Methods in Physics Research B, 15, p.169 - 172, 1986/00
Times Cited Count：15 Percentile：83.33(Instruments & Instrumentation)no abstracts in English
; Ono, Shinichi
JAERI-M 85-110, 44 Pages, 1985/08
no abstracts in English
ion impact effects on SiO, AlO
and MgO;
Journal of Nuclear Materials, 128-129, p.605 - 608, 1984/00
Times Cited Count：8 Percentile：65.33(Materials Science, Multidisciplinary)no abstracts in English
primary ions; Kondo, Tatsuo
Nihon Kinzoku Gakkai-Shi, 47(6), p.494 - 501, 1983/00
no abstracts in English
